The VALID SL in-circuit and functional test system is designed for high-channel-count testing in demanding electronics manufacturing environments. Introduces a cable-free architecture with new ...
Engineers are starting to build hardware that does not just run artificial intelligence, it behaves like a primitive form of ...
Abstract: Automotive electronics typically operate in high-temperature environments with significant electrostatic interference, which increases the reliability requirements for on-chip electrostatic ...
Abstract: In this study, SiGe channel nanosheet field-effect transistor (NSFET) with a novel channel release stopping layer (CRSL), namely CRSL-SiGe NSFET, is proposed to addresses the issue of ...