Abstract: As the feature size of dynamic random access memories (DRAM) continues to scale down, the shrunk storage capacitors have met essential challenges, namely, the insufficient capacitances and ...
Abstract: This article reports the time-dependent dielectric breakdown (TDDB) reliability of zirconia (ZrO2)-based MIM capacitors with sub-0.7-nm equivalent oxide thicknesses (EOT). Results indicate ...
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Generated events can be a one to many subscribers, or multiple events to a single subscriber. Button events are managed by a FSM triggered by ISR events and timer callbacks. Minimal to no processing ...
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