Abstract: This paper presents an in-depth analysis of fast Bias Temperature Instability (BTI) and Time-Dependent Dielectric Breakdown (TDDB) in DRAM CMOS periphery devices, focusing on NMOS and PMOS ...
Abstract: In the course of Cu/low-k technology development and qualification, low-k time-dependent dielectric breakdown (TDDB) is rapidly becoming one of the most important reliability issues. In ...
Consumer Reports uses data to compile an annual list of the most reliable new car brands. Some brands on the list are obvious while others are moving up reliability rankings. Reliability is a huge ...
Digital £8.99 per month, cancel any time. Which? members also get access to the our car brand reliability tool, which lets you look up reliability data for individual brands and, where available, ...
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