Abstract: This paper validates the accuracy of radar cross section (RCS) measurements conducted in an environment that significantly reduces the three main costs associated with RCS measurements: ...
In recent years, electronics engineers have been trying to identify semiconducting materials that could substitute for ...
Abstract: As gate-all-around nanosheet transistors (GAA NSFETs) replacing current FinFETs for their superior gate control capabilities, it needs various performance optimizations for better transistor ...
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