Electronic Design

Tackling Next-Generation RF SOC Test

Developing an automated production test solution for current and next-generation complex RF SIP/SOC devices is an increasingly difficult task. Both the test program and the device interface board (DIB ...
Semiconductor Engineering

Supporting Multiple Time Domains In SoC Production Test

Complex system-on-chip (SoC) devices make every stage of the development flow harder, and the challenges continue even after the silicon is fabricated. Automatic test equipment (ATE) screening for ...
Security

Vector Flow demonstrating next generation AI-driven PIAM and SOC automation solutions

Vector Flow is demonstrating its innovative PIAM and SOC automation solutions here at GSX 2022 in suite 1050. The advanced cloud-enabled and on-premises platform converts raw physical security data ...
Semiconductor Engineering

Software-Driven and System-Level Tests Drive Chip Quality

Traditional semiconductor testing typically involves tests executed by automatic test equipment (ATE). But engineers are beginning to favor an additional late-test pass that tests systems-on-chip ...