Scanning probe microscopy (SPM) encompasses a diverse range of techniques that enable the interrogation of surfaces with atomic-scale precision. These methods, including atomic force microscopy (AFM), ...

At its core, SPM operates on the principle of measuring interactions between a sharp probe and the surface of a material. As the probe scans across the surface, it detects variations in physical ...

Overview of the main types of Scannig Probe Microscope types: Scanning tunneling microscope (STM) – using the tunneling current I between the outermost atom of a conducting probe within an atomic ...

Atomic force microscopy (AFM) is a type of scanning probe microscopy that is used to see and measure surface topography, conduct force measurements or manipulate a sample’s surface. It can have nearly ...

Thought LeaderProf. Dr. Sergei KalininProfessor & Chief Scientist in AI/ML for Physical SciencesUniversity of Tennessee & Pacific Northwest Laboratory In this interview, Prof. Dr. Sergei Kalinin ...

AFM differs significantly from traditional microscopy techniques as it does not project light or electrons on the sample's surface to create its image. Instead, AFM utilizes a sharp probe while ...

Scanning transmission electron microscopy, or STEM, is a powerful imaging technique that enables researchers to study a material’s morphology, composition, and bonding behavior at the angstrom scale.

All matter is made of very small units called atoms. Atoms are so small they cannot be seen using a regular microscope. Scientists have discovered a way to “see” atoms using a special instrument ...