A Psychologist Shares A Science-Inspired Quiz To Test If You’re A ‘Pattern-Seer’

There's a line of thought that equates intelligence with “pattern recognition.” How do you stack up on this unique cognitive ...
EDN

Hierarchical test improves pattern application efficiency

For over 15 years, I've been a big proponent of hierarchical test. Hierarchical test is the commonly used term for creating DFT (design-for-test) features and test patterns at lower level circuit ...
Hackaday

test pattern

[Nicholas Murray]’s Composite Test Pattern Generator is a beautifully-made, palm-sized tool that uses an ESP32-based development board to output different test patterns in PAL/NTSC. If one is checking ...
Semiconductor Engineering

Automatic Test Pattern Generation (ATPG)

ATPG (Automatic Test Pattern Generation and Automatic Test Pattern Generator) is an EDA method/technology used to find an input or test sequence. When applied to a digital circuit, ATPG enables ...
EDN

New test points slash ATPG test pattern count

Scan testing has been the foundation of digital-device production test for many years. Several innovations have been developed to keep up with the growth in pattern-set sizes brought about by large ...
Electronic Design

Low-pin-count test helps manage test cost

The ability to control test cost while design sizes have grown exponentially is a success story that relies on the invention and continuous improvement of embedded test compression. One way test ...