The measured ellipsometric parameters (Ψ and Δ) include the physical properties of the layer structure being analyzed. This information shows the layer thickness and refractive index concerning the ...
Toyohashi University of Technology researchers in collaboration with Massachusetts Institute of Technology (MIT), have developed a new material capable of retaining high transmissivity after thermal ...
The phenomenon of zero refractive index, exhibited by ZIMs, has proven highly useful, especially in the fields of waveguiding and optics. Silicon carbide, classified as a polaritonic material, ...
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